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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Arquitectura de Computadors |
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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.contributor | Universitat Politècnica de Catalunya. VIRTUOS - Virtualisation and Operating Systems |
dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Amat Bertran, Esteve |
dc.contributor.author | Canal Corretger, Ramon |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.date | 2018 |
dc.identifier.citation | Amat, E., Canal, R., Rubio, A. Modem gain-cell memories in advanced technologies. A: IEEE International Symposium on On-Line Testing and Robust System Design. "2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, (IOLTS 2018): 2–4 July 2018, Spain". Institute of Electrical and Electronics Engineers (IEEE), 2018, p. 65-68. |
dc.identifier.citation | 978-1-5386-5992-2 |
dc.identifier.citation | 10.1109/IOLTS.2018.8474151 |
dc.identifier.uri | http://hdl.handle.net/2117/125975 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | https://ieeexplore.ieee.org/document/8474151 |
dc.relation | info:eu-repo/grantAgreement/ES/1PE/TEC2013-45638-C3-2-R |
dc.relation | info:eu-repo/grantAgreement/ES/1PE/TEC2016-75151-C3-2-R |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject | Integrated circuits -- Reliability |
dc.subject | DRAM |
dc.subject | FinFET |
dc.subject | Gain-cells |
dc.subject | SRAM |
dc.subject | Dynamic random access storage |
dc.subject | Systems analysis |
dc.subject | Advanced technology |
dc.subject | Memory cell |
dc.subject | Non destructive |
dc.subject | Read operation |
dc.subject | Reliability problems |
dc.subject | Subthreshold |
dc.subject | Static random access storage |
dc.subject | Circuits integrats -- Fiabilitat |
dc.title | Modem gain-cell memories in advanced technologies |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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