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dc.contributor.author | Van Der Hofstadt, Marc |
---|---|
dc.contributor.author | Fabregas, Rene |
dc.contributor.author | Biagi, Maria Chiara |
dc.contributor.author | Fumagalli, Laura, 1959- |
dc.contributor.author | Gomila Lluch, Gabriel |
dc.date | 2018-09-05T14:45:25Z |
dc.date | 2018-09-05T14:45:25Z |
dc.date | 2016-09-06 |
dc.date | 2018-09-05T14:45:25Z |
dc.identifier.citation | 0957-4484 |
dc.identifier.citation | 667663 |
dc.identifier.uri | http://hdl.handle.net/2445/124317 |
dc.format | 13 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | Institute of Physics (IOP) |
dc.relation | Versió postprint del document publicat a: https://doi.org/10.1088/0957-4484/27/40/405706 |
dc.relation | Nanotechnology, 2016, vol. 27, num. 40, p. 405706 |
dc.relation | https://doi.org/10.1088/0957-4484/27/40/405706 |
dc.rights | (c) Institute of Physics (IOP), 2016 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Dielèctrics |
dc.subject | Nanotecnologia |
dc.subject | Microscòpia de força atòmica |
dc.subject | Dielectrics |
dc.subject | Nanotechnology |
dc.subject | Atomic force microscopy |
dc.title | Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/acceptedVersion |
dc.description.abstract |