Title:
|
Minimizing rework costs in multistage production processes by modifying quality specification limits
|
Author:
|
de-Felipe, David; Benedito Benet, Ernest
|
Other authors:
|
Universitat Politècnica de Catalunya. Departament d'Organització d'Empreses; Universitat Politècnica de Catalunya. SCOM - Supply Chain and Operations Management |
Abstract:
|
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting /republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works |
Abstract:
|
Multistage production processes are becoming more important in the industry to ensure levels of flexibility, efficiency and modularity. Thus, the way in which companies define optimal production parameters related to production costs and quality must be adapted to this reality. In this paper we introduce a multi-response optimization (MRO) model for a two stage production process. The model gives first stage quality specification limits which minimize the rework costs caused by the nonconforming parts of the whole process. The proposed model is applied to an example based on a production process of the automotive industry. The benefits of the model are evaluated by comparing the capability and the rework costs of the multistage production process before and after the optimization. |
Abstract:
|
Peer Reviewed |
Subject(s):
|
-Àrees temàtiques de la UPC::Informàtica::Automàtica i control -Quality control -Manufacturing processes -Production -Optimization -Industries -Covariance matrices -Adaptation models -Automotive engineering -Gaussian distribution -Control de qualitat -Logística (Indústria) |
Rights:
|
Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
Document type:
|
Article - Published version Conference Object |
Published by:
|
Institute of Electrical and Electronics Engineers (IEEE)
|
Share:
|
|