S-parameter measurement of chip Ga As FETs up to 22 GHz using the TRL calibration technique

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RECERCAT Home > Universitat Politècnica de Catalunya > Documents de recerca > View document

To access the full text documents, please follow this link: http://hdl.handle.net/2117/85606

dc.contributor	Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.contributor	Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
dc.contributor.author	Pradell i Cara, Lluís
dc.contributor.author	Artal, E
dc.contributor.author	Sabater, C
dc.date	1989
dc.identifier.citation	Pradell, L., Artal, E., Sabater, C. S-parameter measurement of chip Ga As FETs up to 22 GHz using the TRL calibration technique. A: European Microwave Conference. "Conference proceedings, 19th European Microwave Conference Monday 4th to Thursday 7th September 1989, Wembley Conference Centre, London, United Kingdom". London: Institute of Electrical and Electronics Engineers (IEEE), 1989, p. 576-581.
dc.identifier.citation	0 946821 76 3
dc.identifier.citation	10.1109/EUMA.1989.334030
dc.identifier.uri	http://hdl.handle.net/2117/85606
dc.language.iso	eng
dc.publisher	Institute of Electrical and Electronics Engineers (IEEE)
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Àrees temàtiques de la UPC::Enginyeria de la telecomunicació
dc.subject	Radio frequency
dc.subject	Calibration
dc.subject	Connectors
dc.subject	Radiofreqüència
dc.title	S-parameter measurement of chip Ga As FETs up to 22 GHz using the TRL calibration technique
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	info:eu-repo/semantics/conferenceObject
dc.description.abstract	In this paper, the design of a Microstrip Test Fixture for TRL calibration is described. Experimental results for S-parameters measurement of a GaAs FET chip in the 3-22 GHz frequency range are presented. Repeatability of connections and measurements is discussed and experimental results are also presented.
dc.description.abstract	Peer Reviewed

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