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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Barroso, F. |
dc.contributor.author | Bosch i Puig, Salvador |
dc.contributor.author | Tort Escribà, Núria |
dc.contributor.author | Arteaga Barriel, Oriol |
dc.contributor.author | Sancho i Parramon, Jordi |
dc.contributor.author | Jover, Eric |
dc.contributor.author | Bertran Serra, Enric |
dc.contributor.author | Canillas i Biosca, Adolf |
dc.date | 2016-05-02T10:12:27Z |
dc.date | 2016-05-02T10:12:27Z |
dc.date | 2010-12-17 |
dc.date | 2016-05-02T10:12:32Z |
dc.identifier.citation | 0040-6090 |
dc.identifier.citation | 586487 |
dc.identifier.uri | http://hdl.handle.net/2445/98142 |
dc.format | 5 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | Elsevier B.V. |
dc.relation | Versió postprint del document publicat a: http://dx.doi.org/10.1016/j.tsf.2010.12.051 |
dc.relation | Thin Solid Films, 2010, vol. 519, p. 2801-2805 |
dc.relation | http://dx.doi.org/10.1016/j.tsf.2010.12.051 |
dc.rights | (c) Elsevier B.V., 2010 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | El·lipsometria |
dc.subject | Nanoestructures |
dc.subject | Interferometria |
dc.subject | Ellipsometry |
dc.subject | Nanostructures |
dc.subject | Interferometry |
dc.title | Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/acceptedVersion |
dc.description.abstract |