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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.contributor.author | Gómez Pau, Álvaro |
dc.contributor.author | Balado Suárez, Luz María |
dc.contributor.author | Figueras Pàmies, Joan |
dc.date | 2014 |
dc.identifier.citation | Álvaro Gómez-Pau; Balado, L.; Figueras, J. Criteria for indirect measurements in M-S testing. A: Workshop on Statistical Test Methods. "Handout of papers: 1st Workshop on statistical test methods: 29-30 May 2014, Paderborn, germany: fringe event to ETS 2014". Paderborn: 2014, p. 1-6. |
dc.identifier.uri | http://hdl.handle.net/2117/26217 |
dc.language.iso | eng |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura |
dc.subject | Linear integrated circuits |
dc.subject | Mixed signal circuits |
dc.subject | Mixed-Signal Test |
dc.subject | Analog Test |
dc.subject | Alternate Test |
dc.subject | Indirect Measurements |
dc.subject | Alternate Feature Selection |
dc.subject | Signature Selection |
dc.subject | Optimum Measures Selection |
dc.subject | Quadtrees |
dc.subject | Octrees |
dc.subject | Analog Filter |
dc.subject | Circuits integrats lineals |
dc.subject | Circuits integrats mixtos |
dc.title | Criteria for indirect measurements in M-S testing |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |