To access the full text documents, please follow this link: http://hdl.handle.net/2117/25521
dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
---|---|
dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.contributor.author | Gómez Pau, Álvaro |
dc.contributor.author | Balado Suárez, Luz María |
dc.contributor.author | Figueras Pàmies, Joan |
dc.date | 2014 |
dc.identifier.citation | Álvaro Gómez-Pau; Balado, L.; Figueras, J. Quality metrics for mixed-signal indirect testing. A: Design of Circuits and Integrated Systems Conference. "XXIX Conference on Design of Circuits and Integrated Systems". Madrid: 2014, p. 1-6. |
dc.identifier.uri | http://hdl.handle.net/2117/25521 |
dc.language.iso | eng |
dc.relation | http://www.cei.upm.es/dcis/ |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Electronics |
dc.subject | Enginyeria electrònica |
dc.title | Quality metrics for mixed-signal indirect testing |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |