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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Amat Bertran, Esteve |
dc.contributor.author | Calomarde Palomino, Antonio |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.date | 2013 |
dc.identifier.citation | Amat, E.; Calomarde, A.; Rubio, J.A. Reliability study on technology trends beyond 20nm. A: International Conference Mixed Design of Integrated Circuits and Systems. "Mixed design of integrated circuits and systems MIXDES 2013: proceedings of the 20th international conference: Gdynia, Poland: 20-22 June 2013". Gdynia: Lodz University of Technology, 2013, p. 414-418. |
dc.identifier.citation | 978-83-63578-01-5 |
dc.identifier.uri | http://hdl.handle.net/2117/21142 |
dc.language.iso | eng |
dc.publisher | Lodz University of Technology |
dc.relation | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6613386 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject | Semiconductors |
dc.subject | Semiconductors |
dc.title | Reliability study on technology trends beyond 20nm |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |