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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies |
dc.contributor.author | Torrents Dolz, Josep M. |
dc.contributor.author | Pallàs Areny, Ramon |
dc.date | 2000 |
dc.identifier.citation | Torrents i Dolz, J. M.; Pallás Areny, R. Uncertainty analysis in two-terminal impedance measurements with residual correction. A: Instrumentation and Measurement Technology Conference. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Piscataway, 2001, Vol. 3, 1450-1453 |
dc.identifier.citation | 0-7803-6646-8 |
dc.identifier.uri | http://hdl.handle.net/2117/1303 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers |
dc.relation | 18th IEEE Instrumentation and Measurement Technology Conference |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura |
dc.subject | Impedance (Electricity) |
dc.subject | Impedance measurements |
dc.subject | Residual correction |
dc.subject | Impedància (Electricitat) |
dc.title | Uncertainty analysis in two-terminal impedance measurements with residual correction |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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