Título:
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Nanoscale imaging of buried topological defects with quantitative X-ray magnetic microscopy
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Autor/a:
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Blanco-Roldán, Cristina; Quirós, Carlos; Sorrentino, A.; Hierro-Rodríguez, A.; Álvarez-Prado, Luis Manuel; Valcárcel, R.; Duch, M.; Torras, Núria; Esteve, Jaume; Martín Carbajo, José Ignacio; Vélez Fraga, María; Alameda-Maestro, José María; Pereiro, Eva; Ferrer Fàbregas, Salvador
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Abstract:
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Advances in nanoscale magnetism increasingly require characterization tools providing detailed descriptions of magnetic configurations. Magnetic transmission X-ray microscopy produces element specific magnetic domain images with nanometric lateral resolution in films up to ∼100 nm thick. Here we present an imaging method using the angular dependence of magnetic contrast in a series of high resolution transmission X-ray microscopy images to obtain quantitative descriptions of the magnetization (canting angles relative to surface normal and sense). This method is applied to 55-120 nm thick ferromagnetic NdCo5 layers (canting angles between 65° and 22°), and to a NdCo5 film covered with permalloy. Interestingly, permalloy induces a 43° rotation of Co magnetization towards surface normal. Our method allows identifying complex topological defects (merons or ½ skyrmions) in a NdCo5 film that are only partially replicated by the permalloy overlayer. These results open possibilities for the characterization of deeply buried magnetic topological defects, nanostructures and devices. |
Materia(s):
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-Applied physics -Condensed-matter physics -Microscopy |
Derechos:
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open access
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Tipo de documento:
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Article |
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Uri:
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https://ddd.uab.cat/record/254437
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