Non-homogeneuos conduction of conductive filaments in Ni/HfO2/Si resistive switching structures observed with CAFM

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Title:	Non-homogeneuos conduction of conductive filaments in Ni/HfO2/Si resistive switching structures observed with CAFM
Author:	Claramunt, Sergi; Wu, Qian; Maestro Izquierdo, Marcos; Porti i Pujal, Marc; González, M. B.; Martin Martinez, Javier; Campabadal, Francesca; Nafría i Maqueda, Montserrat
Abstract:	Altres ajuts: ERDF/TEC2011-2792-C02-02
Abstract:	Conductive filaments (CFs) in Ni/HfO₂/Si resistive switching structures are analysed at the nanoscale by means of Conductive Atomic Force Microscopy (CAFM). Differences in the CF conductivity are measured depending on the resistive state of the device. Moreover, for both resistance states, non-homogeneous conduction across the CF area is observed, in agreement with a tree-shaped CF.
Subject(s):	-Resistive switching -CAFM -Metal-insulator-semiconductor (MIS)
Rights:	open access Tots els drets reservats. https://rightsstatements.org/vocab/InC/1.0/
Document type:	Article
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Uri:	https://ddd.uab.cat/record/163085