dc.contributor.author |
Rodríguez-Viejo, Javier |
dc.contributor.author |
Sibieude, F. |
dc.contributor.author |
Clavaguera-Mora, M. T. |
dc.contributor.author |
Monty, C. |
dc.contributor.author |
American Physical Society |
dc.date |
1993 |
dc.identifier |
https://ddd.uab.cat/record/116306 |
dc.identifier |
urn:10.1063/1.110644 |
dc.identifier |
urn:oai:ddd.uab.cat:116306 |
dc.identifier |
urn:recercauab:ARE-4645 |
dc.identifier |
urn:articleid:10773118v63n14p1906 |
dc.identifier |
urn:scopus_id:0000810706 |
dc.identifier |
urn:wos_id:A1993MA20000015 |
dc.identifier |
urn:oai:egreta.uab.cat:publications/39aa7aa3-3883-4324-b81b-b5ab35663b6f |
dc.format |
application/pdf |
dc.language |
eng |
dc.publisher |
|
dc.relation |
Applied physics letters ; Vol. 63, Issue 14 (October 1993), p. 1906-1908 |
dc.rights |
open access |
dc.rights |
Tots els drets reservats. |
dc.rights |
https://rightsstatements.org/vocab/InC/1.0/ |
dc.subject |
Diffusion |
dc.subject |
Mass diffusion |
dc.subject |
Polycrystals |
dc.subject |
Secondary ion mass spectroscopy |
dc.subject |
Silica |
dc.title |
180 diffusion through amorphous SiOs and cristobalite |
dc.type |
Article |
dc.description.abstract |
Secondary ion mass spectrometry was used to profile the diffusion of oxygen in polycrystalline β-cristobalite and vitreous SiO2. The tracer concentration profiles of cristobalite are consistent with a model based on two mechanisms: bulk and short-circuit diffusion. The profiles of partially crystallized samples containing vitreous SiO2 and β-cristobalite were fitted using the sum of two complementary error functions and taking account of some interstitial-network exchange. The bulk oxygen diffusivity, in the temperature range 1240-1500 °C, is about five times greater for vitreous silica than for β-cristobalite. |