dc.contributor.author |
Chávez Ángel, Emigdio |
dc.contributor.author |
Reparaz, Juan Sebastian |
dc.contributor.author |
Gomis-Bresco, Jordi |
dc.contributor.author |
Wagner, Markus R.. |
dc.contributor.author |
Cuffe, John |
dc.contributor.author |
Graczykowski, Bartlomiej |
dc.contributor.author |
Shchepetov, Andrey |
dc.contributor.author |
Jiang, Hua |
dc.contributor.author |
Prunnila, Mika |
dc.contributor.author |
Ahopelto, Jouni |
dc.contributor.author |
Alzina, Francesc |
dc.contributor.author |
Sotomayor Torres, Clivia M. |
dc.date |
2014 |
dc.identifier |
https://ddd.uab.cat/record/204830 |
dc.identifier |
urn:10.1063/1.4861796 |
dc.identifier |
urn:oai:ddd.uab.cat:204830 |
dc.identifier |
urn:scopus_id:84896349744 |
dc.identifier |
urn:articleid:2166532Xv2n1p12113 |
dc.identifier |
urn:wos_id:000332282300016 |
dc.identifier |
urn:oai:egreta.uab.cat:publications/44097928-b87f-4918-bda8-ada846d44e62 |
dc.identifier |
urn:icn2uab:6272988 |
dc.format |
application/pdf |
dc.language |
eng |
dc.publisher |
|
dc.relation |
European Commission 309150 |
dc.relation |
Ministerio de Ciencia e Innovación CSD2010-0044 |
dc.relation |
Ministerio de Ciencia e Innovación MAT2012-31392 |
dc.relation |
APL Materials ; Vol. 2, Issue 1 (January 2014), art. 12113 |
dc.rights |
open access |
dc.rights |
Aquest document està subjecte a una llicència d'ús Creative Commons. Es permet la reproducció total o parcial, la distribució, la comunicació pública de l'obra i la creació d'obres derivades, fins i tot amb finalitats comercials, sempre i quan es reconegui l'autoria de l'obra original. |
dc.rights |
https://creativecommons.org/licenses/by/4.0/ |
dc.title |
Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry |
dc.type |
Article |
dc.description.abstract |
We report on the reduction of the thermal conductivity in ultra-thin suspended Si membranes with high crystalline quality. A series of membranes with thicknesses ranging from 9 nm to 1.5 μm was investigated using Raman thermometry, a novel contactless technique for thermal conductivity determination. A systematic decrease in the thermal conductivity was observed as reducing the thickness, which is explained using the Fuchs-Sondheimer model through the influence of phonon boundary scattering at the surfaces. The thermal conductivity of the thinnest membrane with d = 9 nm resulted in (9 ± 2) W/mK, thus approaching the amorphous limit but still maintaining a high crystalline quality. |