Título:
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Current-induced cleaning of graphene
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Autor/a:
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Moser, Joel; Barreiro Megino, Amelia; Bachtold, Adrian; American Physical Society
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Abstract:
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A simple yet highly reproducible method to suppress contamination of graphene at low temperature inside the cryostat is presented. The method consists of applying a current of several milliamperes through the graphene device, which is here typically a few microns wide. This ultrahigh current density is shown to remove contamination adsorbed on the surface. This method is well suited for quantum electron transport studies of undoped graphene devices, and its utility is demonstrated here by measuring the anomalous quantum Hall effect. |
Materia(s):
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-Graphene -Doping -Atomic force microscopy -Electric currents -Gold -Annealing -Nanoparticles -Current density -Materials properties -Quantum -Hall effects |
Derechos:
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open access
Tots els drets reservats.
https://rightsstatements.org/vocab/InC/1.0/ |
Tipo de documento:
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Article |
Editor:
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Compartir:
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Uri:
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https://ddd.uab.cat/record/116065
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