dc.contributor.author
Meléndez i Frigola, Joaquim
dc.contributor.author
López Ibáñez, Beatriz
dc.contributor.author
Millán Ruiz, David
dc.date.accessioned
2024-06-18T14:38:11Z
dc.date.available
2024-06-18T14:38:11Z
dc.identifier
Meléndez, J., López, B., i Millán-Ruiz, D. (2009). Probabilistic models to assist maintenance of multiple instruments. IEEE Conference on Emerging Technologies & Factory Automation : 2009 : ETFA 2009, 1-4. Recuperat 18 juny 2010, a http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5347263
dc.identifier
http://hdl.handle.net/10256/2668
dc.identifier.uri
http://hdl.handle.net/10256/2668
dc.description.abstract
The paper discusses maintenance challenges of organisations with a huge number of devices and proposes the use of probabilistic models to assist monitoring and maintenance planning. The proposal assumes connectivity of instruments to report relevant features for monitoring. Also, the existence of enough historical registers with diagnosed breakdowns is required to make probabilistic models reliable and useful for predictive maintenance strategies based on them. Regular Markov models based on estimated failure and repair rates are proposed to calculate the availability of the instruments and Dynamic Bayesian Networks are proposed to model cause-effect relationships to trigger predictive maintenance services based on the influence between observed features and previously documented diagnostics
dc.format
application/pdf
dc.relation
info:eu-repo/semantics/altIdentifier/doi/10.1109/ETFA.2009.5347263
dc.relation
info:eu-repo/semantics/altIdentifier/issn/1946-0759
dc.relation
info:eu-repo/semantics/altIdentifier/isbn/978-1-4244-2727-7
dc.rights
Tots els drets reservats
dc.rights
info:eu-repo/semantics/openAccess
dc.source
© IEEE Conference on Emerging Technologies & Factory Automation : 2009 : ETFA 2009, 2009, p. 1-4
dc.source
Articles publicats (D-EEEiA)
dc.subject
Control predictiu
dc.subject
Estadística bayesiana
dc.subject
Markov, Processos de
dc.subject
Medicina -- Aparells i instruments
dc.subject
Bayesian statistical decision
dc.subject
Markov processes
dc.subject
Medical instruments and apparatus
dc.subject
Predictive control
dc.title
Probabilistic models to assist maintenance of multiple instruments
dc.type
info:eu-repo/semantics/article