Título:
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A multistate single-connection calibration for microwave microfluidics
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Autor/a:
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Orloff, Nathan D.; Ma, Xiao; Little, Charles A. E.; Mateu Mateu, Jordi
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Otros autores:
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Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. CSC - Components and Systems for Communications Research Group |
Abstract:
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Abstract:
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With emerging medical, chemical, and biological applications of microwave-microfluidic devices, many researchers desire a fast and accurate calibration that can be achieved in
a single connection. However, traditional on-wafer or coaxial calibrations require measurements of several different artifacts to the data prior to measuring the microwave-microfluidic device.
Ideally, a single artifact would be able to present different impedance states to correct the vector network analyzer data, minimizing drift and eliminating artifact-to-artifact connection
errors. Here, we developed a multistate single-connection calibration that used a coplanar waveguide loaded with a microfluidic channel. We then used measurements of the uncorrected scattering parameters of the coplanar waveguide with the channel empty, filled with deionized water, and filled with 30 w% (30 grams per liter) of saline to construct an eight-term error
model and switch-term correction. After correction, the residuals between measured scattering parameters and with the literaturebased finite-element simulations were below -40 dB from
100 MHz to 110 GHz. This multistate single-connection calibration is compatible with both wafer-probed and connectorized microwave-microfluidic devices for accurate impedance spectroscopy
and materials characterization without the need for multiple device measurements. |
Abstract:
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Peer Reviewed |
Materia(s):
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-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques -Calibration -Microwave circuits -Calibration -Microfluidics -Microwave -Scattering parameters -Vector network analyser (VNA) -Calibratge -Circuits de microones |
Derechos:
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Tipo de documento:
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Artículo - Versión presentada Artículo |
Editor:
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IEEE Microwave Theory and Techniques Society
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