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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Arquitectura de Computadors |
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dc.contributor | Universitat Politècnica de Catalunya. ARCO - Microarquitectura i Compiladors |
dc.contributor.author | Vallero, Alessandro |
dc.contributor.author | Savino, Alessandro |
dc.contributor.author | Politano, Gianfranco |
dc.contributor.author | Di Carlo, Stefano |
dc.contributor.author | Chatzidimitriou, Athanansios |
dc.contributor.author | Tselonis, Sotiris |
dc.contributor.author | Kaliorakis, Manolis |
dc.contributor.author | Gizipoulos, Dimitris |
dc.contributor.author | Riera Villanueva, Marc |
dc.contributor.author | Canal Corretger, Ramon |
dc.contributor.author | González Colás, Antonio María |
dc.contributor.author | Kooli, Maha |
dc.contributor.author | Bosio, Alberto |
dc.contributor.author | Di Natale, Giorgio |
dc.date | 2016 |
dc.identifier.citation | Vallero, A., Savino, A., Politano, G., Stefano Di Carlo, Chatzidimitriou, A., Tselonis, S., Kaliorakis, M., Gizipoulos, D., Riera, M., Canal, R., González, A., Kooli, M., Bosio, A., Di Natale, G. Cross-layer system reliability assessment framework for hardware faults. A: IEEE International Test Conference. "2016 IEEE International Test Conference (ITC): proceedings". Fort Worth, TX: Institute of Electrical and Electronics Engineers (IEEE), 2016, p. 1-10. |
dc.identifier.citation | 978-1-4673-8773-6 |
dc.identifier.citation | 10.1109/TEST.2016.7805863 |
dc.identifier.uri | http://hdl.handle.net/2117/100853 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/document/7805863/ |
dc.relation | info:eu-repo/grantAgreement/EC/FP7/611404/EU/Cross-Layer Early Reliability Evaluation for the Computing cOntinuum/CLERECO |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors |
dc.subject | Hardware -- Reliability |
dc.subject | Dependable computing system |
dc.subject | Reliability modeling |
dc.subject | Cross-layer reliability |
dc.subject | Ordinadors -- Fiabilitat |
dc.title | Cross-layer system reliability assessment framework for hardware faults |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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