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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Eljarrat Ascunce, Alberto |
dc.contributor.author | Gacevic, Zarko |
dc.contributor.author | Fernández-Garrido, S. |
dc.contributor.author | Calleja Pardo, Enrique |
dc.contributor.author | Magén, César |
dc.contributor.author | Estradé Albiol, Sònia |
dc.contributor.author | Peiró Martínez, Francisca |
dc.date | 2016-03-02T13:37:42Z |
dc.date | 2016-03-02T13:37:42Z |
dc.date | 2012-10-12 |
dc.date | 2016-03-02T13:37:47Z |
dc.identifier.citation | 1431-9276 |
dc.identifier.citation | 615031 |
dc.identifier.uri | http://hdl.handle.net/2445/96055 |
dc.format | 12 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | Cambridge University Press |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1017/S1431927612001328 |
dc.relation | Microscopy and Microanalysis, 2012, vol. 18, num. 05, p. 1143-1154 |
dc.relation | http://dx.doi.org/10.1017/S1431927612001328 |
dc.rights | (c) Cambridge University Press, 2012 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Propietats òptiques |
dc.subject | Espectroscòpia d'electrons |
dc.subject | Optical properties |
dc.subject | Electron spectroscopy |
dc.title | (V)EELS characterization of InAlN/GaN distributed Bragg reflectors |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |