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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. RFEMC - Grup de Radiofreqüència i Compatibilitat Electromagnètica en Xarxes de Comunicacions |
dc.contributor.author | Berbel Artal, Néstor |
dc.contributor.author | Fernández García, Raúl |
dc.contributor.author | Gil Galí, Ignacio |
dc.date | 2015 |
dc.identifier.citation | Berbel, N.; Fernandez-Garcia, R.; Gil, I. Modeling technique of the conducted emission of integrated circuit under different temperatures. "International journal of numerical modeling. Electronic networks devices and fields", 2015. |
dc.identifier.citation | 0894-3370 |
dc.identifier.citation | 10.1002/jnm.2076 |
dc.identifier.uri | http://hdl.handle.net/2117/28179 |
dc.language.iso | eng |
dc.relation | http://onlinelibrary.wiley.com/doi/10.1002/jnm.2076/abstract |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject | Integrated circuits |
dc.subject | Heat - Conduction |
dc.subject | ICEM-CE |
dc.subject | integrated circuit |
dc.subject | EMC |
dc.subject | internal activity |
dc.subject | FSV |
dc.subject | conducted emissions |
dc.subject | temperature |
dc.subject | Circuits integrats |
dc.subject | Calor--Conducció |
dc.title | Modeling technique of the conducted emission of integrated circuit under different temperatures |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
dc.description.abstract |