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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Mateo Peña, Diego |
dc.date | 2009 |
dc.identifier.citation | Rubio, A.; Altet, J.; Mateo, D. Advanced failure detection techniques in deep submicron CMOS integrated circuits. A: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. "Reliability of electron devices, failure physics and analysis: 10th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 99), held in Arcachon, near Bordeaux, France from 5-8 October 1999". Arcachon: Pergamon Press, 2009, p. 909-918. |
dc.identifier.citation | 10.1016/S0026-2714(99)00122-5 |
dc.identifier.uri | http://hdl.handle.net/2117/27315 |
dc.language.iso | eng |
dc.publisher | Pergamon Press |
dc.relation | http://www.sciencedirect.com/science/article/pii/S0026271499001225# |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject | Microelectronics |
dc.subject | Integrated circuits |
dc.subject | Microelectrònica |
dc.subject | Circuits integrats |
dc.title | Advanced failure detection techniques in deep submicron CMOS integrated circuits |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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