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| dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
|---|---|
| dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
| dc.contributor.author | Pouyan, Peyman |
| dc.contributor.author | Amat, Esteve |
| dc.contributor.author | Rubio Sola, Jose Antonio |
| dc.date | 2014 |
| dc.identifier.citation | Pouyan, P.; Amat, E.; Rubio, A. Reliability challenges in design of memristive memories. A: European workshop on CMOS Variability. "Proceedings VARI 2014". Palma Mallorca: 2014. |
| dc.identifier.citation | 10.1109/VARI.2014.6957074 |
| dc.identifier.uri | http://hdl.handle.net/2117/25636 |
| dc.language.iso | eng |
| dc.rights | info:eu-repo/semantics/openAccess |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
| dc.subject | Electronics |
| dc.subject | Memristors |
| dc.subject | Memristors |
| dc.subject | Circuits elèctrics |
| dc.title | Reliability challenges in design of memristive memories |
| dc.type | info:eu-repo/semantics/submittedVersion |
| dc.type | info:eu-repo/semantics/conferenceObject |
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