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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. TIEG - Terrassa Industrial Electronics Group |
dc.contributor.author | Berbel Artal, Néstor |
dc.contributor.author | Fernández García, Raúl |
dc.contributor.author | Gil Galí, Ignacio |
dc.date | 2014-08-01 |
dc.identifier.citation | Berbel, N.; Fernandez-Garcia, R.; Gil, I. Characterization and modeling of the conducted emission of integrated circuits up to 3 GHz. "IEEE transactions on electromagnetic compatibility", 01 Agost 2014, vol. 56, núm. 4, p. 878-884. |
dc.identifier.citation | 0018-9375 |
dc.identifier.citation | 10.1109/TEMC.2013.2294256 |
dc.identifier.uri | http://hdl.handle.net/2117/24147 |
dc.language.iso | eng |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics |
dc.subject | Integrated circuits |
dc.subject | Electromagnetic compatibility |
dc.subject | Microwave integrated circuits |
dc.subject | Impedance (Electricity) |
dc.subject | Conducted emissions |
dc.subject | electromagnetic compatibility (EMC) |
dc.subject | feature selective validation (FSV) |
dc.subject | integrated circuit (IC) |
dc.subject | IC emission model (ICEM-CE) |
dc.subject | internal activity (IA) |
dc.subject | computational electromagnetics CEM |
dc.subject | selective validation FSV |
dc.subject | Circuits integrats |
dc.subject | Compatibilitat electromagnètica |
dc.subject | Circuits integrats de microones |
dc.subject | Impedància (Electricitat) |
dc.title | Characterization and modeling of the conducted emission of integrated circuits up to 3 GHz |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
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