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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Aymerich Capdevila, Nivard |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.date | 2013 |
dc.identifier.citation | Aymerich, N.; Rubio, J.A. Extending the fundamental error bounds for asymmetric error reliable computation. A: IEEE/ACM International Symposium on Nanoscale Architectures. "Proceedings of the 2013 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH): 15–17 July 2013: New York City, USA". New York: IEEE Industrial Electronics Society, 2013, p. 106-109. |
dc.identifier.citation | 978-1-4799-0873-8 |
dc.identifier.citation | 10.1109/NanoArch.2013.6623053 |
dc.identifier.uri | http://hdl.handle.net/2117/21660 |
dc.language.iso | eng |
dc.publisher | IEEE Industrial Electronics Society |
dc.relation | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6623053 |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject | Fault tolerance (Engineering) |
dc.subject | Integrated circuits |
dc.subject | Nano architectures |
dc.subject | Fault tolerance |
dc.subject | Fault tolerant systems |
dc.subject | Logic gates |
dc.subject | Noise measurement |
dc.subject | Reliability theory |
dc.subject | Uncertainty |
dc.subject | Tolerància als errors (Enginyeria |
dc.subject | Circuits integrats |
dc.title | Extending the fundamental error bounds for asymmetric error reliable computation |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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