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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Aymerich Capdevila, Nivard |
dc.contributor.author | Cotofana, Sorin |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.date | 2013-11 |
dc.identifier.citation | Aymerich, N.; Cotofana, S.; Rubio, J.A. Controlled degradation stochastic resonance in adaptive averaging cell-based architectures. "IEEE transactions on nanotechnology", Novembre 2013, vol. 12, núm. 6, p. 888-896. |
dc.identifier.citation | 1536-125X |
dc.identifier.citation | 10.1109/TNANO.2013.2270301 |
dc.identifier.uri | http://hdl.handle.net/2117/21052 |
dc.language.iso | eng |
dc.relation | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6544688 |
dc.relation | info:eu-repo/grantAgreement/EC/FP7/248789/EU/TERASCALE RELIABLE ADAPTIVE MEMORY SYSTEMS/TRAMS |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència |
dc.subject | Nanoelectronics |
dc.subject | Fault-tolerant computing |
dc.subject | Aging |
dc.subject | Averaging cell |
dc.subject | Fault-tolerance |
dc.subject | Hardware redundancy |
dc.subject | Nanoscale technology |
dc.subject | Reliabilit |
dc.subject | Nanoelectrònica |
dc.subject | Tolerància als errors (Informàtica) |
dc.title | Controlled degradation stochastic resonance in adaptive averaging cell-based architectures |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
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