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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Bertomeu i Balagueró, Joan |
dc.contributor.author | Puigdollers i González, Joaquim |
dc.contributor.author | Asensi López, José Miguel |
dc.contributor.author | Andreu i Batallé, Jordi |
dc.date | 2013-11-08T08:06:02Z |
dc.date | 2013-11-08T08:06:02Z |
dc.date | 1997 |
dc.date | 2013-11-08T08:06:03Z |
dc.identifier.citation | 0169-4332 |
dc.identifier.citation | 113130 |
dc.identifier.uri | http://hdl.handle.net/2445/47604 |
dc.format | 21 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | Elsevier B.V. |
dc.relation | Versió postprint del document publicat a: http://dx.doi.org/10.1016/S0169-4332(96)00600-9 |
dc.relation | Applied Surface Science, 1997, vol. 108, num. 2, p. 211-217 |
dc.relation | http://dx.doi.org/10.1016/S0169-4332(96)00600-9 |
dc.rights | (c) Elsevier B.V., 1997 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Espectroscòpia infraroja |
dc.subject | Pel·lícules fines |
dc.subject | Hidrogen |
dc.subject | Semiconductors amorfs |
dc.subject | Porositat |
dc.subject | Infrared spectroscopy |
dc.subject | Thin films |
dc.subject | Hydrogen |
dc.subject | Amorphous semiconductors |
dc.subject | Porosity |
dc.title | Infrared characterization of a-Si:H/a-Si1-xCx:H interfaces |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/acceptedVersion |
dc.description.abstract |