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Título:
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Secondary Ion Mass Spectrometry (SIMS): principles and applications
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Autor/a:
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López Fernández, Francisco
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Otros autores:
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Universitat de Barcelona |
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Abstract:
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This article outlines the basis of the technique and shows some examples of applications in order to exhibit the expectations of this technique invaried scientific fields. |
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Abstract:
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Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 |
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Fecha de creación:
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07-11-2013 |
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Materia(s):
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-Espectrometria de masses
-Anàlisi instrumental
-Mass spectrometry
-Instrumental analysis |
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Derechos:
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(c) Universitat de Barcelona, 2012
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Tipo de documento:
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Capítulo o parte de libro |
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Editor:
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Centres Científics i Tecnològics. Universitat de Barcelona
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Compartir:
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