Outage probability analysis for MRC in η-μ fading channels with co-channel interference

Home | About RECERCAT | Contact

Català | Castellano

All of RECERCAT

By Communities &
Collections By Defense Date By Authors By Titles By Subject

This Collection

By Defense Date By Authors By Titles By Subject

Statistics

View Statistics All RECERCAT

My RECERCAT

Other repositories directory

RECERCAT Home > Universitat Pompeu Fabra > Articles, congressos, llibres > View document

To access the full text documents, please follow this link: http://hdl.handle.net/10230/20517

Title:	Outage probability analysis for MRC in η-μ fading channels with co-channel interference
Author:	Morales-Jiménez, David; Paris, José F.; Lozano Solsona, Angel
Abstract:	Exact closed-form expressions are obtained for the outage probability of maximal ratio combining in η-μ fading/nchannels with antenna correlation and co-channel interference. The scenario considered in this work assumes the joint presence of background white Gaussian noise and independent Rayleigh-faded interferers with arbitrary powers. Outage probability results are obtained through an appropriate generalization of the moment-generating function of the/nη-μ fading distribution, for which new closed-form expressions are provided.
Abstract:	The work of D. Morales and A. Lozano is supported by AGAUR (2009/nSGR 70) and by the Spanish Ministry of Science and Innovation (Ref. CONSOLIDER-INGENIO CSD2008-00010 ”COMONSENS”). The work of J. F. Paris was supported in part by the Spanish Government and FEDER project TEC2011-25473.
Subject(s):	-Ràdio -- Interferències -Comunicació sense fil, Sistemes de -Outage probability -η-μ fading -Co-channel interference (CCI) -Maximal ratio combining (MRC)
Rights:	© 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works./nThe final published article can be found at http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6171806
Document type:	Article Article - Accepted version
Published by:	Institute of Electrical and Electronics Engineers (IEEE)
Share:

Show full item record

All of RECERCAT

This Collection

Statistics

My RECERCAT

Related documents

Other documents of the same author