To access the full text documents, please follow this link: http://hdl.handle.net/2117/19701
dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
---|---|
dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Landauer, Gerhard Martin |
dc.contributor.author | González Jiménez, José Luis |
dc.date | 2012 |
dc.identifier.citation | Landauer, G.M.; Gonzalez, J. Carbon nanotube FET process variability and noise model for radiofrequency investigations. A: IEEE International Conference on Nanotechnology. "2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO 2012)". Birmingham: Institute of Electrical and Electronics Engineers (IEEE), 2012, p. 1-5. |
dc.identifier.citation | 978-1-4673-2198-3 |
dc.identifier.uri | http://hdl.handle.net/2117/19701 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6321963 |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Nanoelectronics. |
dc.subject | Field-effect transistors. |
dc.subject | TRANSISTORS INCLUDING NONIDEALITIES |
dc.subject | COMPACT SPICE MODEL |
dc.subject | PART II |
dc.subject | PERFORMANCE |
dc.subject | Nanotubs |
dc.subject | Transistors d'efecte de camp |
dc.title | Carbon nanotube FET process variability and noise model for radiofrequency investigations |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |