Fault-tolerance capacity of the multilevel active clamped topology

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dc.contributor	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.contributor	Escola Tècnica Superior d'Enginyeria Industrial de Barcelona
dc.contributor	Universitat Politècnica de Catalunya. GREP - Grup de Recerca en Electrònica de Potència
dc.contributor.author	Nicolás Apruzzese, Joan
dc.contributor.author	Busquets Monge, Sergio
dc.contributor.author	Bordonau Farrerons, José
dc.contributor.author	Alepuz Menéndez, Salvador
dc.contributor.author	Calle Prado, Alejandro
dc.date	2011
dc.identifier.citation	Nicolas, J. [et al.]. Fault-tolerance capacity of the multilevel active clamped topology. A: IEEE Energy Conversion Congress and Exposition. "IEEE ECCE 2011 proceedings: IEEE Energy Conversion Congress and Exposition: September 17-22, 2011, Hyatt Regency Phoenix, Arizona". Phoenix, AR: IEEE, 2011, p. 3411-3418.
dc.identifier.citation	978-1-4577-0541-0/11
dc.identifier.citation	10.1109/ECCE.2011.6064230
dc.identifier.uri	http://hdl.handle.net/2117/19159
dc.language.iso	eng
dc.publisher	IEEE
dc.relation	http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6064230&tag=1
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights	info:eu-repo/semantics/openAccess
dc.rights	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subject	Àrees temàtiques de la UPC::Enginyeria electrònica
dc.subject	Electrical engineering.
dc.subject	CONVERTER
dc.subject	Enginyeria elèctrica
dc.title	Fault-tolerance capacity of the multilevel active clamped topology
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	info:eu-repo/semantics/conferenceObject
dc.description.abstract	Thanks to the inherent redundancy to generate the different output voltage levels, the multilevel active clamped (MAC) topology presents an important fault-tolerance ability which makes it interesting for several applications. This paper presents an analysis of the fault-tolerance capacity of the MAC converter. Both open-circuit and short-circuit faults are considered and the analysis is carried out under single-device and two-simultaneous-device faults. Switching strategies to overcome the limitations caused by faults are proposed. Experimental tests with a four-level MAC prototype are presented to validate the analysis.

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