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| Title: |
Application of matched digital filters to noisy fringe-patterns from complex wavefronts; Optical Measurement Systems for Industrial Inspection IV |
|---|---|
| Author: | Caum Aregay, Jesús; Arasa Marti, Jose; Royo Royo, Santiago; Ares Rodríguez, Miguel |
| Other authors: | Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.; Universitat Politècnica de Catalunya. Departament d'Òptica i Optometria; Universitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica |
| Subject(s): | -Àrees temàtiques de la UPC::Enginyeria electrònica -Metrology -Digital filters -Diffraction patterns -Metrologia -Filtres digitals |
| Rights: | Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
| Document type: | Article - Published version Article |
| Published by: | Proc.SPIE Press |
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