Quantification of dissipation and deformation in ambient atomic force microscopy

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To access the full text documents, please follow this link: http://hdl.handle.net/2117/16725

dc.contributor	Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics
dc.contributor	Universitat Politècnica de Catalunya. SEPIC - Sistemes Electrònics de Potència i de Control
dc.contributor.author	Santos Hernández, Sergio
dc.contributor.author	Gadelrab,, K.
dc.contributor.author	Barcons Xixons, Víctor
dc.contributor.author	Stefancich, M.
dc.contributor.author	Chiesa, Matteo
dc.date	2012-07-20
dc.identifier.citation	Santos, S. [et al.]. Quantification of dissipation and deformation in ambient atomic force microscopy. "New journal of physics", 20 Juliol 2012, vol. 14, p. 1-12.
dc.identifier.citation	1367-2630
dc.identifier.citation	10.1088/1367-2630/14/7/073044
dc.identifier.uri	http://hdl.handle.net/2117/16725
dc.language.iso	eng
dc.relation	http://iopscience.iop.org/1367-2630/14/7/073044
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Àrees temàtiques de la UPC::Física
dc.subject	Àrees temàtiques de la UPC::Enginyeria electrònica
dc.subject	Atomic force microscopy
dc.subject	Dissipative process
dc.subject	Energy hysteresis
dc.subject	Picometer resolution
dc.subject	Sample deformation
dc.subject	Unknown quantity
dc.subject	Microscòpia de força atòmica
dc.title	Quantification of dissipation and deformation in ambient atomic force microscopy
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	info:eu-repo/semantics/article
dc.description.abstract	A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the unknowns only requires the cantilever to be accurately calibrated and the dissipative processes occurring during sample deformation to be well modeled. The theory is validated by comparison with numerical simulations and shown to be able to provide, in principle, values of sample deformation with picometer resolution.

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