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Title:
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Process variability-aware proactive reconfiguration techniques for mitigating aging effects in nano scale SRAM lifetime
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Author:
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Rubio Sola, Jose Antonio; Amat Bertran, Esteve; Pouyan, Peyman
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
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Abstract:
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Process variations and device aging have a significant
impact on the reliability and performance of nano scale
integrated circuits. Proactive reconfiguration is an emerging
technique to extend the lifetime of embedded SRAM memories.
This work introduces a novel version that modifies and enhances
the advantages of this method by considering the process
variability impact on the memory components. Our results show
between 30% and 45% SRAM lifetime increases over the
existing proactive reconfiguration technique and between 1.7X
and ~10X improvement over the non-proactive reconfiguration. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
-Electronic circuit design -- Fiabilitat
-Circuits electrònics -- Reliability |
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Rights:
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Document type:
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Article - Published version
Conference Object |
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Published by:
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IEEE Press. Institute of Electrical and Electronics Engineers
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