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Title:
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SRAM lifetime improvement by using adaptive proactive reconfiguration
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Author:
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Pouyan, Peyman; Amat Bertran, Esteve; Rubio Sola, Jose Antonio
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
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Abstract:
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Modern generations of CMOS technology nodes
are facing critical causes of hardware reliability failures, which were not significant in the past. Such vulnerabilities make it essential to investigate new robust design strategies at the Nanoscale circuit system level. In this paper we have introduced an adaptive proactive reconfiguration technique that considers the inherent process variability (variability-aware) and BTI aging,
and effectively enlarges the SRAM lifetime. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats
-Integrated circuits
-Electrònica
-Circuits integrats |
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Rights:
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Document type:
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Article - Published version
Conference Object |
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Published by:
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IEEE Press. Institute of Electrical and Electronics Engineers
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Share:
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