Determination of the components of the gyration tensor of quartz by oblique incidence transmission two-modulator generalized ellipsometry

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dc.contributor	Universitat de Barcelona
dc.contributor.author	Arteaga Barriel, Oriol
dc.contributor.author	Canillas i Biosca, Adolf
dc.contributor.author	Jellison, Gerald E.
dc.date	2012-04-20T12:13:37Z
dc.date	2012-04-20T12:13:37Z
dc.date	2009
dc.identifier.citation	0003-6935
dc.identifier.citation	572681
dc.identifier.uri	http://hdl.handle.net/2445/24297
dc.format	11 p.
dc.format	application/pdf
dc.language.iso	eng
dc.publisher	Optical Society of America
dc.relation	Reproducció del document publicat a: http://dx.doi.org/10.1364/AO.48.005307
dc.relation	Applied Optics, 2009, vol. 49, núm. 28, p. 5307-5317
dc.relation	http://dx.doi.org/10.1364/AO.48.005307
dc.rights	(c) Optical Society of America, 2009
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	El·lipsometria
dc.subject	Ellipsometry
dc.title	Determination of the components of the gyration tensor of quartz by oblique incidence transmission two-modulator generalized ellipsometry
dc.type	info:eu-repo/semantics/article
dc.type	info:eu-repo/semantics/publishedVersion
dc.description.abstract	The two independent components of the gyration tensor of quartz, g11 and g33, have been spectroscopically measured using a transmission two-modulator generalized ellipsometer. The method is used to determine the optical activity in crystals in directions other than the optic axis, where the linear birefringence is much larger than the optical activity.

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