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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Onabajo, M. |
dc.contributor.author | Gómez Salinas, Dídac |
dc.contributor.author | Aldrete Vidrio, Eduardo |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Mateo Peña, Diego |
dc.contributor.author | Silva-Martínez, José |
dc.date | 2011-06 |
dc.identifier.citation | Onabajo, M. [et al.]. Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variations. "Journal of electronic testing. Theory and applications", Juny 2011, vol. 27, núm. 3, p. 225-240. |
dc.identifier.citation | 0923-8174 |
dc.identifier.citation | 10.1007/s10836-011-5199-6 |
dc.identifier.uri | http://hdl.handle.net/2117/13127 |
dc.language.iso | eng |
dc.relation | http://www.springerlink.com/content/4h79q8r34x782072 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics |
dc.subject | Metal oxide semiconductors, Complementary |
dc.subject | CMOS process variation |
dc.subject | Radio transmitter -- receivers |
dc.subject | RF thermal testing |
dc.subject | RF built-in test |
dc.subject | CMOS |
dc.title | Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variations |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
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