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RECERCAT Home > Universitat Politècnica de Catalunya > Documents de recerca > View document

To access the full text documents, please follow this link: http://hdl.handle.net/2117/10718

Title: Thermal coupling in ICs: aplications to the test and characterization of analogue and RF circuits
Author: Altet Sanahujes, Josep; Mateo Peña, Diego; Aldrete Vidrio, Héctor
Other authors: Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
Abstract:
Subject(s): -Àrees temàtiques de la UPC::Enginyeria electrònica
-Low frequency
-Electric circuits
-Radio frequency
-Electronic engineering
-Electrònica
-Circuits
Rights:
Document type: Article - Published version
Conference Object
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