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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Saulnier, J.B |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Dilhaire, Stefan |
dc.contributor.author | Volz, S. |
dc.contributor.author | Rampnoux, J.M. |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.contributor.author | Grauby, S. |
dc.contributor.author | Patino, L. |
dc.contributor.author | Claeys, W. |
dc.date | 2002-09 |
dc.identifier.citation | Altet, J. [et al.]. Four different approaches for the measurement of IC surface temperature: Application to thermal testing. "Microelectronics journal", Setembre 2002, vol. 33, p. 689-696. |
dc.identifier.citation | 0026-2692 |
dc.identifier.uri | http://hdl.handle.net/2117/10920 |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Scanning thermal microscopy |
dc.subject | Laser reflectometry |
dc.subject | Laser interferometry |
dc.subject | Built-in temperature sensors |
dc.subject | Integrated circuits |
dc.subject | Electronic engineering |
dc.subject | Circuits integrats |
dc.subject | Enginyeria electrònica |
dc.title | Four different approaches for the measurement of IC surface temperature: Application to thermal testing |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract |