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Title: | Four different approaches for the measurement of IC surface temperature: Application to thermal testing |
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Author: | Saulnier, J.B; Altet Sanahujes, Josep; Dilhaire, Stefan; Volz, S.; Rampnoux, J.M.; Rubio Sola, Jose Antonio; Grauby, S.; Patino, L.; Claeys, W. |
Other authors: | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
Abstract: | |
Subject(s): | -Àrees temàtiques de la UPC::Enginyeria electrònica -Scanning thermal microscopy -Laser reflectometry -Laser interferometry -Built-in temperature sensors -Integrated circuits -Electronic engineering -Circuits integrats -Enginyeria electrònica |
Rights: | Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
Document type: | Article - Published version Article |
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