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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Perpiñà, Xavier |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Jordà, Xavier |
dc.contributor.author | Vellvehi, Miquel |
dc.contributor.author | Mestres, Narcís |
dc.date | 2010 |
dc.identifier.citation | Perpiñà, X. [et al.]. Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect. "Optics Letters", 2010, vol. 35, núm. 15, p. 2657-2659. |
dc.identifier.citation | 0146-9592 |
dc.identifier.citation | 10.1364/OL.35.002657 |
dc.identifier.uri | http://hdl.handle.net/2117/10951 |
dc.language.iso | eng |
dc.relation | http://www.opticsinfobase.org/abstract.cfm?uri=ol-35-15-2657 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | System-on-chip design and technologies |
dc.subject | Electronic engineering |
dc.subject | Integrated circuits |
dc.subject | Metal oxide semiconductor field-effect transistors |
dc.subject | Transistors |
dc.subject | Electrònica |
dc.title | Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract |