Title:
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Error probability in synchronous digital circuits due to power supply noise
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Author:
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Martorell Cid, Ferran; Pons, M; Rubio Sola, Jose Antonio; Moll Echeto, Francisco de Borja
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
Abstract:
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This paper presents a probabilistic approach to model
the problem of power supply voltage fluctuations. Error
probability calculations are shown for some 90-nm technology
digital circuits. The analysis here considered gives the
timing violation error probability as a new design quality
factor in front of conventional techniques that assume the
full perfection of the circuit. The evaluation of the error
bound can be useful for new design paradigms where retry
and self-recovering techniques are being applied to the design
of high performance processors. The method here described
allows to evaluate the performance of these techniques
by means of calculating the expected error probability
in terms of power supply distribution quality. |
Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica -Metal oxide semiconductors, Complementary -Electronics -Integrated circuits--Very large scale integration -Electrònica |
Rights:
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Document type:
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Article - Published version Conference Object |
Published by:
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