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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Aldrete Vidrio, Eduardo |
dc.contributor.author | Mateo Peña, Diego |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Amine Salhi, M. |
dc.contributor.author | Grauby, Stéphane |
dc.contributor.author | Dilhaire, Stefan |
dc.contributor.author | Onabajo, M. |
dc.contributor.author | Silva-Martínez, José |
dc.date | 2010-06-08 |
dc.identifier.citation | Aldrete, E. [et al.]. Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements. "Measurement science and technology", 08 Juny 2010, vol. 21, núm. 7, p. 1-10. |
dc.identifier.citation | 0957-0233 |
dc.identifier.citation | 10.1088/0957-0233/21/7/075104 |
dc.identifier.uri | http://hdl.handle.net/2117/8325 |
dc.language.iso | eng |
dc.relation | http://iopscience.iop.org/0957-0233/21/7/075104/pdf/0957-0233_21_7_075104.pdf |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Integrated circuits |
dc.subject | Low noise amplifiers |
dc.subject | Electrònica |
dc.subject | Circuits integrats |
dc.title | Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract |