Toward understanding the wide distribution of time scales in negative bias temperature instability

All of RECERCAT

To access the full text documents, please follow this link: http://hdl.handle.net/2117/7614

Title:	Toward understanding the wide distribution of time scales in negative bias temperature instability
Author:	Kaczer, Ben; Grasser, Tibor; Fernández García, Raúl; Groeseneken, Guido
Other authors:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. TIEG - Terrassa Industrial Electronics Group
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica -Metal oxide semiconductor field-effect transistors -Field-effect transistors -Transistors d'efecte de camp
Rights:
Document type:	Article - Draft Book Part
Share: