Analysis of dielectric-loaded cavities for characterization of the nonlinear properties of high temperature superconductors

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Title:	Analysis of dielectric-loaded cavities for characterization of the nonlinear properties of high temperature superconductors
Author:	Mateu Mateu, Jordi; Collado Gómez, Juan Carlos; Menéndez Nadal, Óscar; O'Callaghan Castellà, Juan Manuel
Other authors:	Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
Abstract:	This work describes and compares two alternative methods of analyzing dielectric-loaded cavities for measurement of intermodulation distortion in HTS films. One of them is based on assuming a specific type of HTS nonlinearities and developing theoretical equations based on them. The second is based on a numerical approach that can be applied to many types of nonlinearities. Both methods are shown to work on measured data of representative HTS films.
Abstract:	Peer Reviewed
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques -High temperature superconductors -Superconductivity -high-temperature superconductors -intermodulation distortion -superconducting cavity resonators -superconducting microwave devices -superconducting thin films -Superconductors a altes temperatures -Superconductivitat
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Document type:	Article
Published by:	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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