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dc.contributor | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions |
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dc.contributor | Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
dc.contributor.author | Lázaro Guillén, Antoni |
dc.contributor.author | Maya Sánchez, Mª del Carmen |
dc.contributor.author | Pradell i Cara, Lluís |
dc.date | 2003 |
dc.identifier.citation | Lázaro, A.; Maya, M. C.; Pradell, L. Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D model. Microwave and optical technology letters, 2003, vol. 39, núm. 4, p. 317-319. |
dc.identifier.citation | 0895-2477 |
dc.identifier.uri | http://hdl.handle.net/2117/1106 |
dc.language.iso | eng |
dc.publisher | JOHN WILEY & SONS INC |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques |
dc.subject | Microwave optics |
dc.subject | Noise Measurement |
dc.subject | Field-effect transistors |
dc.subject | equivalent circuits |
dc.subject | microwave field effect transistors |
dc.subject | high electron mobility transistors |
dc.subject | Schottky gate field effect transistors |
dc.subject | semiconductor device models |
dc.subject | semiconductor device noise |
dc.subject | bias-dependence |
dc.subject | microwave-FET intrinsic noise sources |
dc.subject | hybrid configuration |
dc.subject | quasi-2D physical model |
dc.subject | Thornber current equation |
dc.subject | noise-parameter measurements |
dc.subject | FET noise models |
dc.subject | Soroll -- Mesurament |
dc.subject | Òptica física |
dc.subject | Microones |
dc.subject | Transistors d'efecte de camp |
dc.title | Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D model |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
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