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Title:
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Comparison between nonlinear measurements in patterned and unpatterned thin films
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Author:
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Collado Gómez, Juan Carlos; Mateu Mateu, Jordi; O'Callaghan Castellà, Juan Manuel
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Other authors:
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Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
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Abstract:
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This work compares two alternative methods of characterizing the nonlinearities in a 10 × 10 mm2 superconducting thin film. Both methods are based on measuring the intermodulation distortion in high temperature superconducting (HTS) films. The first method measures the unpatterned film by using a rutile loaded cavity operating at the TE011 mode. The second method is based on intermodulation measurements made in a resonant coplanar line which is patterned on the same film that is used in the rutile cavity. In both experiments we use closed-form expressions and numerical techniques to extract local parameters related to the nonlinearities of the superconductor. The intermodulation data in both type of measurements can be fitted with identical nonlinear parameters of the HTS. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
-High temperature superconductors
-Superconductivity
-Impedance (Electricity) Measurement
-Microwave measurements
-High temperature superconductors
-intermodulation distortion
-current density
-electric impedance measurement
-intermodulation distortion
-intermodulation measurement
-microwave measurement
-superconducting thin films
-surface impedance
-patterned thin films
-unpatterned thin films
-nonlinear measurements
-high temperature superconducting films
-rutile loaded cavity
-resonant coplanar line
-closed-form expressions
-local parameters
-surface impedance
-volume current density
-Superconductors a altes temperatures
-Superconductivitat
-Impedància (Electricitat)
-Microones -- Mesurament |
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Rights:
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Document type:
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Article |
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Published by:
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IOP PUBLISHING LTD
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