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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Gomila Lluch, Gabriel |
dc.contributor.author | Toset Gilabert, Jorge |
dc.contributor.author | Fumagalli, Laura, 1959- |
dc.date | 2012-05-08T09:07:34Z |
dc.date | 2012-05-08T09:07:34Z |
dc.date | 2008-07-25 |
dc.date | 2012-04-20T11:47:48Z |
dc.identifier.citation | 0021-8979 |
dc.identifier.citation | 561608 |
dc.identifier.uri | http://hdl.handle.net/2445/25086 |
dc.format | 8 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | American Institute of Physics |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.2957069 |
dc.relation | Journal of Applied Physics, 2008, vol. 104, núm. 2, p. 024315 |
dc.relation | http://dx.doi.org/10.1063/1.2957069 |
dc.rights | (c) American Institute of Physics, 2008 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Dielèctrics |
dc.subject | Nanotecnologia |
dc.subject | Dielectrics |
dc.subject | Nanotechnology |
dc.title | Nanoscale capacitance microscopy of thin dielectric films |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |