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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Marsal Garví, Lluís F. (Lluís Francesc) |
dc.contributor.author | López Villegas, José María |
dc.contributor.author | Bosch Estrada, José |
dc.contributor.author | Morante i Lleonart, Joan Ramon |
dc.date | 2012-04-30T08:21:52Z |
dc.date | 2012-04-30T08:21:52Z |
dc.date | 1994-07-15 |
dc.date | 2012-04-20T11:52:23Z |
dc.identifier.citation | 0021-8979 |
dc.identifier.citation | 80062 |
dc.identifier.uri | http://hdl.handle.net/2445/24683 |
dc.format | 4 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | American Institute of Physics |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.357826 |
dc.relation | Journal of Applied Physics, 1994, vol. 76, num. 2, p. 1077-1080 |
dc.relation | http://dx.doi.org/10.1063/1.357826 |
dc.rights | (c) American Institute of Physics, 1994 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Espectroscòpia |
dc.subject | Spectrum analysis |
dc.title | Frequency resolved admittance spectroscopy measurements on In0.52Al0.48As/InxGa1¿xAs/In0.52Al0.48As single quantum well structures |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |