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               <dc:title>The role of hydrogen in the formation of microcrystalline silicon</dc:title>
               <dc:creator>Fontcuberta i Morral, A.</dc:creator>
               <dc:creator>Bertomeu i Balagueró, Joan</dc:creator>
               <dc:creator>Roca i Cabarrocas, P. (Pere)</dc:creator>
               <dc:subject>Silici</dc:subject>
               <dc:subject>Hidrogen</dc:subject>
               <dc:subject>Temperatures baixes</dc:subject>
               <dc:subject>Pel·lícules fines</dc:subject>
               <dc:subject>Silicon</dc:subject>
               <dc:subject>Hydrogen</dc:subject>
               <dc:subject>Low temperatures</dc:subject>
               <dc:subject>Thin films</dc:subject>
               <dc:description>The growth mechanisms of microcrystalline silicon thin films at low temperatures (100-250°C) by plasma CVD are still a matter of debate. We have shown that ue-Si:H formation proceeds through four phases (incubation, nucleation, growth and steady state) and that hydrogen plays a key role in this process, particularly during the incubation phase in which hydrogen modifies the amorphous silicon network and forms a highly porous phase where nucleation takes place. In this study we combine in-situ ellipsometry and dark conductivity measurements with ex-situ high resolution transmission electron microscopy to improve our understanding of microcrystalline silicon formation.</dc:description>
               <dc:date>2016-05-23T13:50:00Z</dc:date>
               <dc:date>2016-05-23T13:50:00Z</dc:date>
               <dc:date>2000</dc:date>
               <dc:date>2016-05-11T16:58:30Z</dc:date>
               <dc:type>info:eu-repo/semantics/article</dc:type>
               <dc:type>info:eu-repo/semantics/acceptedVersion</dc:type>
               <dc:relation>Versió postprint del document publicat a: http://dx.doi.org/10.1016/S0921-5107(99)00324-4</dc:relation>
               <dc:relation>Materials Science and Engineering B-Solid State Materials for Advanced Technology, 2000, vol. 69-70, p. 559-563</dc:relation>
               <dc:relation>http://dx.doi.org/10.1016/S0921-5107(99)00324-4</dc:relation>
               <dc:rights>(c) Elsevier B.V., 2000</dc:rights>
               <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
               <dc:publisher>Elsevier B.V.</dc:publisher>
               <dc:source>Articles publicats en revistes (Física Aplicada)</dc:source>
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