2026-04-14T02:48:28Zhttps://recercat.cat/oai/request

oai:recercat.cat:2445/668402025-11-19T20:48:48Zcom_2072_1057col_2072_478812col_2072_478917

Improving the Lateral Resolution of Quartz Tuning Fork-Based Sensors in Liquid by Integrating Commercial AFM Tips into the Fiber End Gonzalez Claramonte, Laura Martínez-Martín, David Otero Díaz, Jorge José de Pablo, Pedro Puig i Vidal, Manuel Gómez-Herrero, Julio Microscòpia de força atòmica Microscòpia electrònica d'escombratge Atomic force microscopy Scanning electron microscopy The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own. 2015-09-08T09:59:47Z 2015-09-08T09:59:47Z 2015-01-14 2015-09-08T09:59:47Z info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion 1424-8220 https://hdl.handle.net/2445/66840 650690 25594596 eng Reproducció del document publicat a: http://dx.doi.org/10.3390/s150101601 Sensors, 2015, vol. 15, p. 1601-1610 http://dx.doi.org/10.3390/s150101601 cc-by (c) Gonzalez Claramonte, Laura et al., 2015 http://creativecommons.org/licenses/by/3.0/es info:eu-repo/semantics/openAccess 10 p. application/pdf application/pdf MDPI Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)