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Nanomechanical properties of molecular organic thin films Caro, J. Fraxedas i Calduch, Jordi Gorostiza Langa, Pablo Ignacio Sanz Carrasco, Fausto Pel·lícules fines Microscòpia de força atòmica Elasticitat Nanotecnologia Cristalls Thin films Atomic force microscopy Elasticity Nanotechnology Crystals Using atomic force microscopy we have studied the nanomechanical response to nanoindentations of surfaces of highly oriented molecular organic thin films (thickness¿1000¿nm). The Young¿s modulus E can be estimated from the elastic deformation using Hertzian mechanics. For the quasi-one-dimensional metal tetrathiafulvalene tetracyanoquinodimethane E~20¿GPa and for the ¿ phase of the p-nitrophenyl nitronyl nitroxide radical E~2GPa. Above a few GPa, the surfaces deform plastically as evidenced by discrete discontinuities in the indentation curves associated to molecular layers being expelled by the penetrating tip. 2012-05-08T07:46:18Z 2012-05-08T07:46:18Z 2001-07 2012-05-02T12:04:23Z info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion Reproducció del document publicat a: http://dx.doi.org/10.1116/1.1368662 Journal of Vacuum Science Technology A-Vacuum Surfaces and Films, 2001, vol. 19, p. 1825-1828 http://dx.doi.org/10.1116/1.1368662 (c) American Institute of Physics, 2001 info:eu-repo/semantics/openAccess American Institute of Physics Articles publicats en revistes (Ciència dels Materials i Química Física)